X-Ray Detection, Analysis and Thickness Testing Applications
Whether it’s ensuring the manufacturing of environmentally-friendly products, performing elemental analysis, or accurately measuring your plating thickness—SIINT USA’s precision X-ray detection and XRF equipment is becoming increasingly essential for the profitability of production and process companies globally.
SII NanoTechnology USA’s X-ray, Analysis and Thickness Measurement equipment analyzes all kinds of materials, including but not limited to: minerals, semiconductors, pharmaceuticals, oils, polymers, and metals. SIINT X-ray and XRF equipment are optimally used for the following applications:
- Coating thickness testing
- Elemental analysis
- Chrome plating analysis
- RoHS/WEEE/ELV testing
- Lead-free testing
- Halogen analysis
- Contaminant analysis
- Reverse RoHS
- Non-destructive precious metal testing
- And more!
