SFT9500 Series Fluorescent X-ray Coating Thickness Gauge

SFT9500 Series, Fluorescent X-ray Coating Thickness Gauge

Name Fluorescent X-ray Coating Thickness Gauge
Type SFT9500 Series
Overview Advanced x-ray microfocus technology has achieved high brilliance beam with an actual beam size of less than 0.1mm in diameter. Consequently, SFT9500 Series is capable of measurements of micro spots and thin film applications, such as lead frames, connectors, and flexible PCBs, that are difficult to measure with conventional models due to in sufficient fluorescent X-ray intensity from measurement samples.
Features
  • Ultra Thin Film and Multilayered Film Measurement
    Poly capillary, X-ray focusing optics system, enables micro beam size of less than 0.1mm in diameter with high intensity that is equivalent to 50 times that of conventional collimator models in Au plating measurement. As a result, SFT9500 series has a capability of quantitative measurement of single nano meter of Au with high accuracy. Besides, it can simultaneously measure each coating thickness of layers in multilayered applications, such as Au/Pd/Ni/Cu and Au/Ni/Ti/Si.
  • Mapping
    Mapped image with micro beam is effective for the distribution analysis of plating thickness and specific elements.
  • Hazardous Substance Analysis (for RoHS and ELV compliance)
    SFT9500 provides the best solution for quantitative analysis of hazardous substances. High resolution semiconductor detector liquid nitrogen free is able to detect microelements. Examples are Pb in Pb-free solder and electoless Nickel that are typical component in Electric, Electronics, and Auto products.
  • Particle Analysis
    High intensity micro beam combined with high count rate detector makes possible of particle analysis. CCD camera can specify particles, and then subtraction spectrum display functions the qualitative analysis of the particles.
  • Data Editing Function
    MS-EXCEL® is equipped with statistical processing function that compiles measurement data as STDEV, Mean, Max, Min, CV, and Cpk. MS-WORD® provides detailed measurement reports with the sample image

Specifications

Elements Measured Atomic Numbers 13(Al) to 83(Bi)
X-Ray Tube Tube Voltage : 50kV, Current : 1mA
Detector Semiconductor Detector (Liquid Nitrogen Free)
X-Ray Focusing Optics System Capillary
X-Ray Beam Size 0.1mmf
Sample Observation CCD Camera (With zoom)
Focus Laser Pointer
Filter Primary Filters
X-Ray Station Desktop Personal Computer(OS: Microsoft Windows XP) , 19”LCD Monitor
Coating Thickness Software Film Analysis FP Method (Max 5 Layer Coating, 10 Elements)
Calibration Curve Method (Single & Double Layer, Composition of Alloy Foils)
Quantitative Analysis Bulk FP
Options Mapping Software, Judgment Software for Hazardous Substance, Spectrum Matching Software, Image Processing
Measurement Function Automatic Measurement, Canter Searching
Data Processing Microsoft Excel and Microsoft Word installed
Report Safety Interlocking Sample Door, Sample Collision Prevention Mechanism (crash protection), Diagnostic Function
*Microsoft and Windows are registered trademarks of Microsoft Corporation in the United States and other countries.

Switching Mechanism

Applications Maximum 5 layers (10 element maximum for each layer) Multi-layer Plating
Alloy Plating Maximum 10 elements

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