News/Clippings

19
May

Launch of the SEA6000VX Fluorescent X-ray Analyzer equipped with High-Speed Mapping Measurement Function

Improved Efficiency of Hazardous Metal Testing in Micro-spot via High Sensitivity and High-speed Measurement

Today, SII NanoTechnology Inc. has released the SEA6000VX, an energy dispersive fluorescent X-ray Analyzer for high-speed, high sensitivity measuring of traces of metal in micro-spot which does not require liquid nitrogen.

The fluorescent X-ray analyzer, praised for its measurement speed and easy use, has been widely introduced as an incoming and outgoing inspection instrument which helps decide whether components and products comply with environmental regulations such as RoHS Directive. With environmental directives such as ELV as well as RoHS, along with trends toward lead-free and halogen-free in toys and RPF*1, the need for measurement of environmentally regulated substances continues to spread. There are, however, strong practical needs for further improvement of measurement efficiency and solutions for complicated measurements. Requirements for measurement of composite components including assembled printed circuit boards that could not be met by conventional devices, such as measurement of micro-spot on specific parts without disassembling components and management of harmful substances over the entire board, have become apparent, raising demand for development of devices that can satisfy such needs.

The SEA6000VX is an instrument that enables high speed measurement of micro-spots with considerable improvement in sensitivity. Equipped with our unique Vortex, a liquid nitrogen-free semiconductor detector with high count rate, and a new X-ray generating system design, the SEA6000VX boasts improved sensitivity on the order of 10 times or greater than of conventional models. As such, measurements of trace hazardous substances conventionally conducted in relatively large analytical areas (about 5 - 10mm) can now be conducted in much smaller areas (about 0.5 - 1.2mm) in the same measurement time or less.

The combination of the improvement of sensitivity in the micro-spot and a high-speed electric stage has enabled high speed two-dimensional elemental mapping. High-speed mapping of the 100mm x 100mm assembled printed circuit board allows detection of eutectic solder of sub-millimeter size in approximately two minutes. Furthermore, increasing the frequency of mapping allows lead detection at 1,000 ppm level, which is the regulated value stipulated by the RoHS directive, in approximately 30 minutes. It can now be determined whether the entire assembled printed circuit board is lead-free.

In addition, operability and improvement in measurement stability has been achieved by equipping an optical system that allows observation in a wide, high-resolution visual field in order to locate the measurement site as well as by installing a high accuracy X-Y stage.

Through the addition of the surface exposure type SEA6000VX to the conventional undersurface exposure type SEA1000A and SEA1200VX, SII NanoTechnology's hazardous substance measuring fluorescent X-ray analyzers have become a product lineup that can handle a variety of measurement targets.

[Main Features]

1. High-Speed Mapping Measurement
The combination of significantly improved sensitivity of micro-spot fluorescent X-ray analysis and continuous high-speed electric stage activation enables high-speed, two-dimensional elemental mapping images. Special filters for lead mapping in particular have been added to strengthen compliance with lead mapping in the board. It is also possible to map quantities of lead even less than 1,000 ppm located in the lead-free solder.

2. High Resolution, Wide Area Optical System
A high resolution optical image of 20 micrometers or less can be acquired over an area of 250mm x 200mm. The location of measurement can be specified directly from this optical image with a high level of accuracy, resulting in dramatically improved operability. Additionally, overlapping the optical image with the mapping image obtained by high-speed mapping enables highly accurate analysis over a wide area.

3. High-speed Measurement of Trace Metal in Micro Spot
High sensitivity is possible through the high-density micro X-ray beam, on-board detector with a high count rate, and design that employs the detection efficiency of a fluorescent X-ray. The trace metals in the micro-spots and thin film can be measured in a short time. Hazardous substances in a 1mm x 1mm area can be measured in approximately 100 seconds.

4. High Count Rate Detector not Requiring Liquid Nitrogen
Comes standard equipped with SII NanoTechnology's unique High Count Rate Detector Vortex, for which the hassle of liquid nitrogen supply is unnecessary. Additionally, start-up time is as short as several minutes, and, as it is a thermoelectric cooling type, it is highly reliable. The device is very environmentally friendly thanks to reduced power consumption owing to increased measurement speed efficiency, reduced carbon dioxide generation during manufacturing and transportation of liquid nitrogen, and other factors.

5. Measurement of Film Thickness in Micro-spots
It is possible to measure the thickness of a thin film composite plating of Au/Ni/Cu (gold/nickel/copper) with an area of 0.2mm x 0.2mm with high accuracy in approximately 10 seconds. In addition, trace amounts lead contained in lead-free solder plating and electroless nickel plating can also be analyzed.

[Main Specifications]
X-ray Tube: Tube Voltage:50 kV, Current: 1mA
Detector: Semiconductor detector (liquid nitrogen-free)
Beam Diameter: 0.2x0.2mm, 0.5x0.5mm, 1.2x1.2mm, 3x3mm: automatic switching
Sample Observation: High resolution CCD camera (Dual system)
Maximum Sample Size: 580 (W) x 450 (D) x 150 (H) mm
Filter: Electric power switching (primary: 6 positions)
X-ray Station: Personal computer; 19-inch LCD monitor
Options: Joystick Controller, Signal Tower, Multi Display and other
Data processing: Microsoft^® Excel and Microsoft Word^® installed
Safety functions: Interlocking sample chamber door, sample collision prevention mechanism and device diagnostic mechanism

[Sales Target]
200 units in FY 2008

[Sales Start Date]
June 17, 2008

Fluorescent X-ray Analyzer SEA6000VX

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19
May

Launch of the SFT9550 High-Performance Fluorescent X-Ray Coating Thickness Gauge

Supporting the high-precision measurement of film thickness of large printed circuit boards, electronic parts.

SII NanoTechnology Inc. has released the SFT9550, a fluorescent X-ray coating thickness gauge for measuring the thickness of metal plating, deposition, etc. of large printed circuit boards, electronic parts and the like with high precision as of today, August 1.

Measuring and controlling the coating thicknesses and composition of metallic thin films of plating, deposition and suchlike used in semiconductors, electronic components and printed circuit boards is critical in guaranteeing the functions, quality and cost of the products. These plated products are required to have a high degree of functionality, and becoming increasingly miniaturized and thinly plated. Under these conditions, there is a market requirement to measure thin films with precision in the order of nanometers. In addition, the regulations concerning hazardous substances, as exemplified by the RoHS directives, are increasing the necessity of composition analysis in such ultra-thin platings and micro spot.

The newly released SFT9550 is a product equipped with a stage supporting large specimens of up to 400(X) x 300(Y) x 45(Z) mm, in response to the needs for the measurement of large printed circuit boards or automatic measurement of several specimens in the coating thickness measurement market. Large printed circuit boards, wafers, etc. that were once required to be cut to adjust to the size of the sample stage can be measured as they are. While retaining the highly precise coating thickness measurement and micro part analysis functions of the SFT9500 for coating thickness measurement in ultra-thin plating, vapor deposition, etc. well-reputed since the release in May, 2006, it became possible to reduce the pretreatment for measuring large specimens.

Like the SFT9500, the SFT9550 can perform not only the coating thickness measurement of plated products, but also the qualitative and quantitative analysis of environmentally restricted substances such as lead in micro spots of electric products, automobile products, and such.

SII NanoTechnology Inc. is planning to expand sales focusing on the electronic and electrical equipment and component manufacturers as well as auto manufacturers.

[Main Features]

1. Measurement of large specimen Loaded with a large stage, a large specimen (up to 400(X) x300 (Y) x45 (Z) mm), which could not be measured conventionally without having it cut, can be measured as it is. Moreover, many small specimens can be arranged on the stage and automatically measured continuously.

2. Measurement of thin plantings/multi-layered plantings The thickness of each layer for multi-layers (gold / palladium / nickel / copper material or gold / nickel / titanium / silicon wafer) in the field of semiconductors and electronic parts can be measured simultaneously at the level of several nanometers. With the high-intensity of the micro beam (diameter of 0.1mm) by adopting an X-ray collecting system (capillary), the X-ray is detected with the intensity of up to 50 times compared with the conventional models, and the thin plating is measured with high precision. Measurements of micro spots and thin platings, such as lead frame, connector and flexible substrate, etc., can be performed.

3. Mapping function The mapping function using the micro beam makes it possible to easily and quickly observe the distribution of the plating thickness of the sample, as well as the distribution of specific elements therein. In particular, it is effective to check a lead-free soldering part in the mounting board.

4. Analytical function Equipped with "Vortex," a liquid nitrogen-free semiconductor detector with a high counting rate and high resolution, the qualitative and quantitative analysis of an unknown specimen can be conducted. Furthermore, a foreign body can be analyzed by the micro beam.

5. Data editing functions Microsoft Excel and Microsoft Word are installed as standard. Microsoft Excel is equipped with statistical processing functions that enable statistical processing of measured data, average values, maximum and minimum values, C.V. values, Cpk, etc. Microsoft Word makes it possible to easily create reports on the results of measurements, including the sample image.

[Specifications]
X-ray Tube: Tube Voltage: 50 kV, Current: 1 mA
Detector: Semiconductor detector (liquid nitrogen-free)
Collimator: Actual irradiation 0.1 mm in diameter (light focus method)
Sample Observation: CCD camera (with zoom)
Focus: Laser pointer
Sample stage: 400 (X) x 300 (Y) x 50 (Z) mm
Maximum sample height: 45mm
Filter: Electric power switching (primary: 3 positions)
Operation: Personal computer; 19-inch LCD monitor
Measurement software: Calibration curve method, Film analysis FP method (bulk/thin films)
Options: Mapping software, Judgment software for hazardous substances, Spectrum matching Software and image processing software
Measuring functions: Automatic measurement and center searching
Data processing: Microsoft Excel and Microsoft Word installed
Safety functions: Interlocking sample door, sample collision prevention mechanism and device diagnostic mechanism

[Price] 14,900,000 yen (tax excluded)
[Sales Start Date] August 1, 2007
[Sales Target] 20 units in FY2007

High-Performance Fluorescent X-ray Coating Thickness Gauge SFT9550

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19
May

Please post comments/questions on this Forum

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12
May

A Very Large Area (100 mm²) Silicon Drift Detector

A Very Large Area (100 mm²) Silicon Drift Detector

Shaul Barkan, Valeri D. Saveliev, Liangyuan Feng, Masanori Takahashi, Elena V. Damron,
Carolyn R. Tull
SII NanoTechnology USA, Northridge, CA 91324
A 100 mm² silicon drift detector (SDD) has been developed in an effort to improve the solid
angle of our Vortex^® SDD. The 100 mm² SDD features the same basic structure as our smaller area
(50 mm²) devices and possesses the same advantages of the drift detectors, including low noise, high
count rate, thermoelectric cooling and excellent energy resolution [1,2].

Theoretically, a large active area SDD should perform similarly to its smaller should perform similarly to its smaller area counterpart.

In both designs, the generated charges are collected at the very small anode, which loads the
preamplifier with the same very small input capacitance, and hence, the energy resolution as a function
of amplifier peaking time should be quite independent of the detector’s size. However, in practice, a
large area SDD will be expected to have some energy resolution and peak-to-background (P/B)
degradation due to a longer drift path, which creates some additional imperfect charge collection that
affects the overall performance.

The 100 mm² SDD is ideal for low or high count rate applications in which the x-rays of
interest are occurring over a large solid angle, such as is encountered in TXRF and some synchrotron
applications. The 100 mm² SDD was configured in our standard Vortex^® package with a Canberra
Amplifier model 2026X, and evaluated in response to 55Fe as a function of peaking time. Figure 1
shows the response of the 0.35 mm thick, 100 mm² SDD to 55Fe, showing an energy resolution of 135
eV FWHM at 6 s peaking time, with a P/B of better than 1800:1. This performance is the best that
we know of to date for such as large area SDD. This spectrum was collected without any collimation,
and we expect a further improvement in P/B with collimation. We will present additional results of
energy resolution, P/B, and peak stability as a function of count rate and collimation, and also results
using this large area device in a TXRF application.

Figure 1. Response of 100 mm² SDD to 55Fe, at 6 µs peaking time. Energy resolution is 135 eV
FWHM, with P/B 1800:1 with no collimation.

References:
[1] S. Barkan, J.S. Iwanczyk, B.E. Patt, L. Feng, C.R. Tull and G. Vilkelis, “VortexTM – A new high performance silicon
drift detector for XRD and XRF Applications”, Advances in X-Ray Analysis, 46 (2003) 332-337.
[2] S. Barkan, V. Saveliev, J. Iwanczyk, L. Feng, C. Tull, B. Patt, D. Newbury, J. Small, N. Zaluzec, “A New Improved
Silicon Multi-Cathode Detector (SMCD) for Microanalysis and X-Ray Mapping Applications”, Microscopy Today, 12
(2004) 36-37.

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4
May

Improved Silicon Drift Detectors Applied to X-ray Fluorescence and Total XRF, Electron Microscopy and Synchrotron Applications

SII NanoTechnology USA Inc. (SIINT) recently improved the designs of their 50mm² silicon drift detectors (SDD) by allowing a close sample-to-detector geometry and increasing the detectors' solid angle. These customizations permit SDDs to be placed under a sample at optimal proximity, reducing signal collection time. The new designs also increase high rate capability.

SII's 4 silicon drift detector elements are positioned in a square arrangement. Heat is removed through a heat pipe heat transfer; detectors are cooled down using Peltier coolers. This design has an active area totaling 180mm² and an output rate of 2Mcps.

Additionally, the improved designs allow the detectors' active area to be placed directly under the sample. This "close geometry" design actually increases count rate and is suitable for the characterization of nanoparticles at high spatial resolution.

"Because this characterization has become extremely important in state-of-the-art materials research, SII NanoTechnology USA will continue to develop original nanotechnology equipment for applications such as x-ray spectroscopy and x-ray fluorescence measurements," says Gordon Myers, SIINT Vice President of Sales and Marketing.

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1
Jan

Trade Show Participation 2011

Pittcon
Atlanta, GA
March 13-18, 2011

Q2XAFS 2011
Tokyo, Japan
April 12-13, 2011

APS Users Week 2011
Argonne, Illinois
May 2-6, 2011

NSLS Users Week 2011
Brookhaven, Upton NY
May 23-25, 2011

SES Conference 2011
Saskatoon, SK Canada
June 22-24, 2011

Microscopy & Microanalysis 2011
Nashville, TN
August 7-11, 2011

Denver X-Ray 2011 (reg and paid)
Colorado Springs, CO
August 1-5, 2011

ICXOM 21
LNLS, Campinas Brazil
September 5-8, 2011

SSRL Users Meeting
SSRL, Menlo Park, CA
October 17-21, 2011

IEEE 2011
Valencia, Spain

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3
Jul

Announcing the Release of the SEA1200VX Element Monitor, a Highly Sensitive Fluorescent X-Ray Analyzer

Optimal system for RoHS/WEEE compliance and advanced analysis

On July 3, SII NanoTechnology Inc. (SIINT) will release the SEA1200VX Element Monitor, an energy-dispersive, highly sensitive fluorescent X-ray Analyzer that does not require liquid nitrogen. This new system incorporates a newly developed X-ray detector, featuring improved sensitivity and resolution, as well as its wide range of application field.

Under the EU's WEEE and RoHS directives on electrical and electronic equipment and the ELV directive on scrap cars that regulate the use of hazardous substances, there is increased demand for an energy-dispersive fluorescent X-ray analyzer because of its nondestructive method, its simplicity of measurement, and its sensitivity. There is also greater demand for more sophisticated systems due to the increasing complexity of samples to be measured and the need to measure smaller trace components and a greater diversity of expertise among operators.

SII NanoTechnology has developed the SEA1200VX fluorescent X-ray analyzer featuring improved sensitivity and resolution, which can be used in a greater variety of applications. The SEA1200VX is equipped with a new fluorescent X-ray detector, the Vortex, a unique device that has a high level of sensitivity, high resolution and a high count rate (capable of counting a large quantity of X-rays). Thanks to the substantially improved sensitivity of the SEA1200VX, it is possible to significantly reduce the time needed to measure a sample with a complex structure. Since it is possible to conduct measurements in a vacuum, light elements can also be measured, and it is possible to conduct component analysis of various materials such as metals, minerals, glass and resin. Moreover, operators of all skill levels can use the system. Different modes of operation can be selected, ranging from measurement menus for novices to complex modes that make the most of the function of the system. Therefore, the system is suitable for a wide range of applications from inspecting materials to general analysis.

Total shipments of SII NanoTechnology fluorescent X-ray equipments have exceeded 6,000 units and the company intends to expand the range of application of fluorescent X-ray analysis as well as meet the compliance requirements for controlling hazardous substances through the release of the high-performing SEA1200VX.

Main features of the SEA1200VX

1. High Resolution
The resolution of the SEA1200VX is superior to that of conventional systems that require liquid nitrogen, and the system is capable of conducting measurements in a vacuum, enabling it to perform qualitative and quantitative analyses of a wide variety of materials such as metals, minerals, glass and resin. The system offers optimal performance in analysis applications in divisions that specialize in analysis as well as in material analysis, quality control and assessment measurements.

2. High Sensitivity
The newly developed, high count rate detector, the Vortex, used in conjunction with a filter, enables materials such as PVC (polyvinyl chloride) resins and metals to be measured and analyzed with a high degree of sensitivity. The minimum detection limit has been reduced to between one-half and one-fifth that of the company conventional model that requires liquid nitrogen. The Vortex detector can detect X-rays at least 50 times stronger than the conventional model. By combining with the precision control software that controls precision (variation) of element concentration and conduct the measurement in the optimal time, measuring time is greatly reduced.
For example, the measuring time of lead (Pb) in PVC resin, which is regulated by the RoHS directive, can be reduced to one-thirtieth of the conventional models, and to one-tenth for lead (Pb) or cadmium (Cd) in metals.

3. Liquid Nitrogen Free
The unit is equipped with a detector that does not require liquid nitrogen, thereby eliminating the need for a cumbersome maintenance of liquid nitrogen. Since the start-up time is just a few minutes, it is possible to conduct quick and reliable measurement.

4. Light Element Analysis
Since the SEA1200VX can conduct measurements in a vacuum; it is possible to conduct measurements on the elements from sodium to uranium. This property of the SEA1200VX also improves the effectiveness of its measurements on nonferrous metals, minerals, glass, ceramics, resins, paints, soil, foods and such like.

5. Ease of Use, from Novices to Professionals
This system is easy to use and can be operated by novices while also catering to the needs of professional operators in terms of the flexibility of its settings. When measuring a hazardous metal subject to the RoHS directive, this unit is easy to operate since it offers a menu that allows the shortest measurement time while guaranteeing essential reliability. The measured data is automatically stored in a prescribed location, enabling a detailed report to be output at any time. On the other hand, switching to the professional operator mode enables free selection of the measurement conditions and setting of the detector, to best match the sample. In this way, analyzing samples in fields where conventional energy dispersive fluorescent X-ray analyzer could not be used has become a practical reality.

Specifications
X-ray Generator: 50kV, 1mA, Air-cooled
Primary Filter: 5 mode auto-switching
Beam Size: 1mm & 8mm auto-switching
Detector: Liquid nitrogen free
Sample Chamber: W 430 ~ D 320 ~ H200 mm

Target Price
10,000,000 yen (tax excluded)

Sales Target
300 units
Sales Start Date
July 3, 2006

SEA1200VX

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6
Jun

Library of Congress Uses X-ray Fluorescence Spectrometer to Examine Old Artifacts

The Library of Congress (LoC), the world's largest library, contains roughly 150 million books, maps, photos and posters. Committed to the preservation and digitization of information, the LoC uses state-of-the-art methods and technology to examine and scan it vast collection of historical objects, books and maps.

One method used in the Library of Congress Preservation Research and Testing Division is scanning electron microscopy. A scanning electron microscope (SEM) can capture the minute details of a sample's surface topography, composition and other properties.

Among the many technologically-advanced machines available, the Library of Congresses uses x-ray fluorescence spectrometers to study the deterioration of objects. When examining damaged artifacts like corrosion on a book, Jennifer Wade, a Library of Congress preservation specialist, says: "What is it caused by? What could stop it? Interpretation is important."

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14
Oct

Acquisition of U.S. Radiant Detector Technologies X-ray Detector Business

SII NanoTechnology Inc. announces today that its US subsidiary SII NanoTechnology USA Inc. has made the Asset Purchase Agreement with Radiant Detector Technologies, LLC (Radiant) on October 14, 2005, and agreed to acquire the X-ray detector business of Radiant, under which SII NanoTechnology USA shall succeed from Radiant all intellectual property rights, equipment, facilities and employees related to the X-ray detector business of Radiant. Operations of the X-ray detector business will commence effective November 1, 2005.

This acquisition is expected to allow SII NanoTechnology to enhance fluorescent X-ray analysis key element technology, accelerate the new product development, increase the competitiveness in the world stage, and expand the environment analysis market share.

SII NanoTechnology Inc. first entered the business of developing and manufacturing fluorescent X-ray coating thickness gauges in 1970, and has been continuously engaged in the development, manufacture, and sales of fluorescent X-rays analyzers and fluorescent X-ray coating thickness gauges over 35 years. By making best use of SII NanoTechnology proprietary and unique X-ray analysis technology, the company has been supplied wide range of products; the company released fluorescent X-ray coating thickness gauges equipped with in-house semiconductor detector ideal for microscopic analysis in 1988, the portable, compact and lightweight fluorescent X-ray analyzers in 1999, and liquid-nitrogen-free high-sensitivity fluorescent X-ray monitors for hazardous substances in 2004.

Radiant was established in Northridge, California, in 2001 by Jan. S. Iwanczyk, Ph.D. and Bradley E. Patt, Ph.D. and has been engaged in the development, manufacture and sales of silicon multi-cathode drift-type X-ray detectors. Radiant customers represent some of the finest industrial equipment manufacturers in the world, as well as many national laboratories and research facilities around the world. The Radiant X-ray detectors have achieved accolades due to its large size, very high count rates, excellent energy resolution and liquid nitrogen-free operation.

[About Radiant Detector Technologies] (as of October 13, 2005)

Company name: Radiant Detector Technologies, LLC
Representative: Jan S. Iwanczyk (President)
Establishment: 2001
Business Description: Development, manufacture, and sales of X-ray detectors
Number of Employees: 13
Fiscal Year: January to December
Head office: 19355 Business Center Dr., Suite #9, Northridge, CA 91324, and U.S.A.

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Recent Posts

- Launch of the SEA6000VX Fluorescent X-ray Analyzer equipped with High-Speed Mapping Measurement Function
- Launch of the SFT9550 High-Performance Fluorescent X-Ray Coating Thickness Gauge
- Please post comments/questions on this Forum
- A Very Large Area (100 mm2) Silicon Drift Detector
- Improved Silicon Drift Detectors Applied to X-ray Fluorescence and Total XRF, Electron Microscopy and Synchrotron Applications
- Trade Show Participation 2011
- Announcing the Release of the SEA1200VX Element Monitor, a Highly Sensitive Fluorescent X-Ray Analyzer
- Library of Congress Uses X-ray Fluorescence Spectrometer to Examine Old Artifacts
- Acquisition of U.S. Radiant Detector Technologies X-ray Detector Business

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