SIINT USA: Pushing the Boundaries of NanoTechnology

SII NanoTechnology USA Inc. is the world's leading instrument development company, dedicated to the research, development and commercialization of X-ray detectors and spectrometric systems. From research and design, to superior after-sales support, SII NanoTechnology continues to push the boundaries of nanotechnology to bring simple, innovative and cost-saving X-ray and XRF solutions to the world.

Many of the most successful research and development companies in the world trust SIINT equipment for the following applications:

• X-ray spectroscopy
• X-ray fluorescence measurements
• X-ray microscopy and x-ray analysis
• Synchrotron radiation applications
• Process control
• Environmental monitoring
• Spent fuel measurement and verification

X-Ray Detection, Analysis and Thickness Testing Applications
Whether it's ensuring the production of environmentally-friendly products, performing elemental analysis or accurately measuring your plating thickness, SIINT precision X-ray detection and XRF equipment is becoming more and more essential for the profitability of manufacturing and process companies worldwide.

We sell, service and support X-ray and XRF equipment used in applications such as coating thickness testing, elemental analysis, chrome plating analysis, RoHS/WEEE/ELV testing, lead-free testing, halogen analysis, contaminant analysis, reverse RoHS, non-destructive precious metal testing and more.